CMC

Review Notes for July 6, 2000 


Overview

Prof. Roxann Engelstad


 

 
 

EUV Mask Modeling

 

Jaewoong Sohn
Transient Thermal Analysis of EUV Mask Patterning

 
 


 
 

SCALPEL Mask Modeling

 

Carl Martin and Eric Weisbrod
Resist CD Uniformity Across a SCALPEL Mask



 
 

 


Questions, Comments? email: dmrumpf@students.wisc.edu