CMC

Review Notes for February 7, 2001 


Overview

Prof. Roxann Engelstad


  
 
 

Optical Mask Modeling Update

 

Andy Mikkelson
Pattern Transfer Distortions in Optical Reticles
 

 


 Eric Cotte
Simulating Pellicle-Induced Distortions from Temperature Variations

 


 Thin Film Characterization Update

 

Ning Tang
Range of Validity for the Point - Deflection Technique
 
 

 


 
 


Questions, Comments? email: dmrumpf@students.wisc.edu