CMC

Review Notes for December 7, 2000 


Overview

Prof. Roxann Engelstad


 
 
 
 
 

Optical Mask Modeling Update

Andrew Mikkelson

Pattern Transfer Distortions in Optical Photomasks

 

Alexander Wei

Finite Element Analysis of Localized Heating in 

Optical Substrates Due to E-beam Patterning
 

 

 

EUV Mask Modeling Update

Phil Reu

Modeling Mask Fabrication and Pattern Transfer 

Distortions for EPL Stencil Masks

 


Questions, Comments? email: dmrumpf@students.wisc.edu