CMC

Review Notes for August 5, 1999 


Overview

Prof. Roxann Engelstad



 
 
 
 
 

Optical Mask Modeling Update

 

Lowell Siewert
Determination of Photomask Thin Film Stresses by Curvature Measurements
 
 

Jaewoong Sohn
Thermomechanical Distortions in Silicon Dioxide and Calcium Fluoride Photomasks from E-beam Writing


 
 
 
 
 
 

SCALPEL Mask Modeling Update

Carl Martin
Mechanical and Thermal Modeling of the SCALPEL Mask Exposure Process
 
 
 
 
 


Questions, Comments? email: dmrumpf@students.wisc.edu